The 643 Single Tilt Analytical Holder incorporates design features optimized for electron diffraction and EDX analysis of crystalline TEM specimens.
主要特点:
Key Features
Low background design
Beryllium specimen cradle, Hexring® and Anti-twist washer to gently and securely hold the specimen in place
Reduced Shadowing
Optimized for EDX analysis
Integral Faraday Cup
Quantitative measurement of the incident electron current
Tilt ranges and compatibility of specimen holders vary according to the TEM manufacturer, model, pole piece gap, and the presence of in-gap accessories. Please contact your local Gatan representative for more information.
科扬国际贸易(上海)有限公司为您提供GATAN643 Single Tilt Analytical Holder-643单倾分析样品杆,GATAN643产地为美国,属于扫描透射电子显微镜,除了643 Single Tilt Analytical Holder-643单倾分析样品杆的参数、价格、型号、原理等信息外,还可为您提供更多扫描透射电子显微镜,科扬国际贸易客服电话,售前、售后均可联系。