简介:【中文摘要】 利用原子力显微镜(AFM)观察超薄切片的表面,探索表面形貌与切片厚度、朝向等因素的关系以及对图像反差的影响.选择三种不同类型的细胞,培养后按电镜超薄切片法固定、包埋并切片后,将不同厚度的切片区分上下表面转移到云母上,AFM在简介:【中文摘要】 利用原子力显微镜(AFM)观察超薄切片的表面,探索表面形貌与切片厚度、朝向等因素的关系以及对图像反差的影响.选择三种不同类型的细胞,培养后按电镜超薄切片法固定、包埋并切片后,将不同厚度的切片区分上下表面转移到云母上,AFM在空气中以接触模式进行观察.结果发现,切片表面细胞相对包埋介质的凸起与凹陷与切片本身的厚度密切相关,并随切片厚度的不同呈现有规律的变化.实验统计结果显示这种现象可能具有普遍性.
【英文摘要】 The effect of the thickness of ultrathin sections on the topographical contrast in the images of atomic force microscopy (AFM) had been studied. Three different cell lines, Tca8113, C6 and ECV-304 were treated with conventional TEM fixation and embedment techniques. Cut by ultramicrotomy and collected with mica pieces, thin sections with different thickness were imaged by AFM on both sides. The images observed from the lower surfaces showed that the cell regions were always concave compared to the epoxy res...详细>