Production range of microscopy detection units covers detectors for scanning (SEM) and transmission (TEM) electron microscopy.
SEM DETECTORS
SE (secondary electron) detection
Flat scintillator (standard)
Conical Geometry (higher light output)
On optical fiber (miniaturized)
BSE (back-scattered electrons) detection
Annular (standard)
Segmented
In-lens (small aperture down to 0.3 mm)
CL (cathodoluminescence)
universal quartz lightguide working at any working distance
parabolic
TEM DETECTORS
STEM detectors
ADF
HADF
BF
TEM detectors
Imaging systems based on thin single crystal screens on FOP
Photon-counting detectors
Crytur cooperates closely with customers on the design and development
and can also deliver special detector designs according to the
custommers needs。