【序号】：1
【作者】：Jau Hwang Ho, Chung Len Lee, Tan Fu Lei
【题名】：Error reduction in the ellipsometric measurement on thin films
【期刊】：Solid-State Electronics
【年、卷、期、起止页码】： August 1988，Volume 31, Issue 8, Pages 1321–1326
【链接】：http://www.sciencedirect.com/science/article/pii/0038110188904327

【序号】：2
【作者】：Park, Sunglim; Jung, Jaewha; Seo, Jeongwoo; Kang, Dongkyun; Gweon, Daegab
【题名】：Auto-alignment for incident angle of ellipsometer
【期刊】：Proc. SPIE
【年、卷、期、起止页码】：2001，Volume 4564 (1) SPIE – Oct 4
【链接】：http://www.deepdyve.com/lp/spie/auto-alignment-for-incident-angle-of-ellipsometer-VzAtzueV0N/1